Advanced Materials Laboratory
PHYS481
Optical Absorption
In this experiment, students will measure the bandgaps of selinium and gallium phosphide. A thermal evaporator will be used to make a thin film of selenium. Thin film interference is used to determine the index of refraction of selenium. Production of free radicals and thermal "healing" is observed via heat treatment of irradiated PMMA.
Required reading:
Optical Absorption Section of Advanced Materials Laboratory Manual
T. Zoufal, K. Wick, B. Bodmann: The Damaging Process in Irradiated Light Guides and Scintillating Fibres. In: Nuclear Inst. Meth. B, vol. 208, (2003) p. 471-475.
J.C. Manifacier, J. Gasiot, J.P. Fillard: A Simple Method of the Determination of the Opical Constants n,k and the Thickness of a Weakly Absorbing Think Film. In: J. Phys. E: Sci. Instrum., Vol. 9, (1986) p.1002-1004
Suggested reading:
A K Bhatnagar et al.: Optical Energy Gap of Amorphous Selenium: Effect of Annealing. In: J. Phys.D: Appl. Phys., Vol 18, (1985). L149-L153.
R. Swanepoel: Determination of the Thickness and Optical Constants of Amorphous Silicon. In: J. Phys. E: Sce. Instrum., Vol 16, (1983). p. 1214-1221.
E. Cetinorgu, S. Goldsmith, RL Boxman: Air Annealing Effects of the Optical Properties of ZnO-SnO2 Thin Films Deposited by a Filtered Vacuum Arc Deposition System. In: Semicond. Sci. Technol. 21 (2006) 364-369.
Cary 50 UV Spectrophotometer Operation Manual
Thermal Evaporator Operating Procedure
Optical Absorption Power Point
Solver Tutorial
Scanning Tunneling Microscopy
In this experiment, students will image various samples to atomic resolution using the Burleigh Instructional STM.
Required Reading:
Burleigh Instructional STM Operating Manual
STM Section of Advanced Materials 1 Laboratory Manual
Y. Kuk, P.J. Silverman: Scanning Tunneling Microscope Instrumentation. In: Rev. Sci. Instrum. 60 (1989) 165-180.
Tersoff, J. : Hamann, D.R.: Theory of the Scanning Tunneling Microscope. In: Physical Review B 31, 1985, p. 805-813.
C. F. Quate,: Vacuum Tunneling: A New Technique for Microscopy. In: Physics Today, Vol. 39, Aug. 1986, pp. 26-33
Suggested Reading:
G. Binnig, H. Rohrer: In Touch with Atoms. In: Reviews of Modern Physics, Vol. 71, No. 2 (1999), pp. S324-S330
Chen, C.J.: Origin of Atomic Resolution of Metal Surfaces in Scanning Tunneling Microscopy. In: Phys. Rev. Letters 65 (4), 1990, p. 448-451.
Gold diffraction grating. Imaged by Sean MacMullin with the Burleigh Instructional STM on September 20, 2007.